Plasens-VIS

PLASENS-VIS

Nano Film Automated Optical Inspection

Incident  photons  with  different  quanta  can  preceptibly  excite relaxed electron of nano  films at very spesific angle.  High energy photons after interaction with low   energy  electron  scatter to a different path with lower energy. Also,they carry the information about the deposited nano layer of a  known or  unknown  material over the film. Broad  band  spectroscopy of  reflected visible  light from different angle is a strong way to study spectrum response ofnano-structures and multi nano-layer of materials.

   COMPREHENSIVE OPTICAL REFLECTION and TRANSMISSION CHARACTERIZATION of THIN FILM

this  machine   practically  is  an  automated  version  of  the  famous kretschmann-otto  optical  configaration. visible  spectroscopy of  the  nano structures of any  kind  (including different state of matter) is a low-cost and feasible way to study the material  science. the fact  behind this   type  of  spectroscopy  is   the visible light and nano-materials are in the same regional size physically. thus, only optical properties  such as  reflection  and transmission effectively describe nano-feature of nano-films.

EASY to USE and GRAPHICAL PLASENCE SYSTEM

Plasens Measurement Principle

GRTC : (General Reflection Transmaission Characterization)

1) Polarized reflective spectrum sweeper with steps from 0.1 to 0.5 degrees and a sweep range of 10-70 degrees.

2) Extraction of radiation spectrum for transparent and translucent films.

IMPS - i : (Internal Memory Projects i)

Simultaneous loading of several graphs from different GRTC projects in one graph and comparing spectral changes.

ERAC : (Especial Reflection Angle Characterisation)

Characterization of spectral ellipsometry based on polarized reflected light waves.

IMPS - ii : (Internal Memory Projects ii)

Simultaneous loading of several graphs from different ERAC projects in one graph and comparing spectral changes.

AUTOMATED OPYICAL STAGE

    Main Features

1. Thin film: transparent at acceptable size of 1.8*1.8*0.05 cm.

2. System measurement mode :  Reflection and transmission.

3. Sweeping mode(general):

    Window size : 10-70 degree.

    Sweeping step size : 0.1 -0.5 degree.

4. Sweeping mode (especific):

    Window size: 1-4 degree.

    Step size: 0.05 degree.

    Sweeping size: 10-70 degree.

5. Polarization status: automaticall swap between s- or p- wave.

6. Prism type: semi-circular with refractive index of 1.6.

7. Light source: broad band (450-800 nm).

8. Spectrometer: visible range (350-800 nm) with 1 nm resolution.

9. Sample holder: replaceable respecting to measurement mode.

SELECTED PLASENS SOFTWARE FEATURES

User Friendly Panel and Fast Processing Measurements

Angle Sweeping with step of 0.05 degree

Plotting Ellipsometry  components

Smoothing and noise  filtering of Measured data

Broadband optical source and  spectrometer device automation controlling panel